Analysis and modeling of total dose effects in advanced bulk CMOS technologies.
by Michael Lee McLain
| Publisher: | Unknows |
| Published In: | 12-Sep-2011 |
| ISBN-10: | 1244103268 |
| ISBN-13: | 9781244103269 |
| Binding Type: | Paperback |
| Weight: | 370 gms |
| Pages: | pp. 166, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "Analysis and modeling of total dose effects in advanced bulk CMOS technologies." is written by Michael Lee McLain. This book was published in the year 1220. The ISBN number 1244103268|9781244103269 is assigned to the Paperback version of this title. This book has total of pp. 166 (Pages). The publisher of this title is Unknows. Analysis and modeling of total dose effects in advanced bulk CMOS technologies. is currently Not Available with us.You can enquire about this book and we will let you know the availability.