Articles On Semiconductor Device Defects, including Electromigration, Radiation Hardening, Qbd (electronics), Silc (semiconductors), Latchup, Thermal Runaway, Catastrophic Optical Damage, Current Crowding, Current Filament
by Hephaestus Books
| Publisher: | Unknows |
| Published In: | 31-Aug-2011 |
| ISBN-10: | 124326375X |
| ISBN-13: | 9781243263759 |
| Binding Type: | Paperback |
| Weight: | 181 gms |
| Pages: | pp. 68, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "Articles On Semiconductor Device Defects, including Electromigration, Radiation Hardening, Qbd (electronics), Silc (semiconductors), Latchup, Thermal Runaway, Catastrophic Optical Damage, Current Crowding, Current Filament" is written by Hephaestus Books. This book was published in the year 3120. The ISBN number 124326375X|9781243263759 is assigned to the Paperback version of this title. This book has total of pp. 68 (Pages). The publisher of this title is Unknows. Articles On Semiconductor Device Defects, including Electromigration, Radiation Hardening, Qbd (electronics), Silc (semiconductors), Latchup, Thermal Runaway, Catastrophic Optical Damage, Current Crowding, Current Filament is currently Not Available with us.You can enquire about this book and we will let you know the availability.