Baseline Testing of Ultracapacitors for the Next Generation Launch Technology (Nglt) Project
by Dennis J. Eichenberg
| Publisher: | Unknows |
| Published In: | 31-Jul-2013 |
| ISBN-10: | 1289260710 |
| ISBN-13: | 9781289260712 |
| Binding Type: | Paperback |
| Weight: | 97 gms |
| Pages: | pp. 28, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "Baseline Testing of Ultracapacitors for the Next Generation Launch Technology (Nglt) Project" is written by Dennis J. Eichenberg. This book was published in the year 3120. The ISBN number 1289260710|9781289260712 is assigned to the Paperback version of this title. This book has total of pp. 28 (Pages). The publisher of this title is Unknows. Baseline Testing of Ultracapacitors for the Next Generation Launch Technology (Nglt) Project is currently Not Available with us.You can enquire about this book and we will let you know the availability.