Calculation of defect densities in nano-crystalline and amorphous silicon devices using differential capacitance measurements.
by Daniel Norbert Congreve
| Publisher: | Unknows |
| Published In: | 17-Jul-2012 |
| ISBN-10: | 1249082765 |
| ISBN-13: | 9781249082767 |
| Binding Type: | Paperback |
| Weight: | 150 gms |
| Pages: | pp. 44 |
The Title "Calculation of defect densities in nano-crystalline and amorphous silicon devices using differential capacitance measurements." is written by Daniel Norbert Congreve. This book was published in the year 1720. The ISBN number 1249082765|9781249082767 is assigned to the Paperback version of this title. This book has total of pp. 44 (Pages). The publisher of this title is Unknows. Calculation of defect densities in nano-crystalline and amorphous silicon devices using differential capacitance measurements. is currently Not Available with us.You can enquire about this book and we will let you know the availability.