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Computed Electron Micrographs and Defect Identification

 
Computed Electron Micrographs and Defect Identification,0444104623,9780444104625

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Book Information

Publisher:North-Holland Pub. Co
Published In:1973
ISBN-10:0444104623
ISBN-13:9780444104625
Weight:200 gms
Pages:x 400 with illus

The Title "Computed Electron Micrographs and Defect Identification" was published in the year 1973. This book has total of x 400 with illus (Pages). The publisher of this title is North-Holland Pub. Co. Computed Electron Micrographs and Defect Identification is currently Not Available with us.You can enquire about this book and we will let you know the availability.