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Dealing with test issues in typical ASIC design flow.

by  Sean Hsi Yuan Wu
Dealing with test issues in typical ASIC design flow.,1244065897,9781244065895

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Book Information

Publisher:Unknows
Published In:11-Sep-2011
ISBN-10:1244065897
ISBN-13:9781244065895
Binding Type:Paperback
Weight:350 gms
Pages:pp. 138

The Title "Dealing with test issues in typical ASIC design flow." is written by Sean Hsi Yuan Wu. This book was published in the year 1120. The ISBN number 1244065897|9781244065895 is assigned to the Paperback version of this title. This book has total of pp. 138 (Pages). The publisher of this title is Unknows. Dealing with test issues in typical ASIC design flow. is currently Not Available with us.You can enquire about this book and we will let you know the availability.