Defect characterization and stress analysis by white beam synchrotron X-ray topography in single crystal semiconducting materials.
by Vishwanath Sarkar
| Publisher: | Unknows |
| Published In: | 17-Jul-2012 |
| ISBN-10: | 1249092531 |
| ISBN-13: | 9781249092537 |
| Binding Type: | Paperback |
| Weight: | 385 gms |
| Pages: | pp. 156 |
The Title "Defect characterization and stress analysis by white beam synchrotron X-ray topography in single crystal semiconducting materials." is written by Vishwanath Sarkar. This book was published in the year 1720. The ISBN number 1249092531|9781249092537 is assigned to the Paperback version of this title. This book has total of pp. 156 (Pages). The publisher of this title is Unknows. Defect characterization and stress analysis by white beam synchrotron X-ray topography in single crystal semiconducting materials. is currently Not Available with us.You can enquire about this book and we will let you know the availability.