Development of Ellipsometric Microscopy As a Quantitative High-Resolution Technique for the Investigation of Thin Films at Glass-Water and Silicon-Air Interfaces
by Felix Linke
| Publisher: | Forschungszentrum Jülich |
| Published In: | 2004 |
| ISBN-10: | 3893363734 |
| ISBN-13: | 9783893363735 |
| Weight: | 200 gms |
| Pages: | pp. 133, Illus. |
The Title "Development of Ellipsometric Microscopy As a Quantitative High-Resolution Technique for the Investigation of Thin Films at Glass-Water and Silicon-Air Interfaces" is written by Felix Linke. This book was published in the year 2004. This book has total of pp. 133 (Pages). The publisher of this title is Forschungszentrum Jülich. Development of Ellipsometric Microscopy As a Quantitative High-Resolution Technique for the Investigation of Thin Films at Glass-Water and Silicon-Air Interfaces is currently Not Available with us.You can enquire about this book and we will let you know the availability.