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Electrical characterization of buckled graphene films derived from plasma etched silicon carbide.

by  Tobias Denig
Electrical characterization of buckled graphene films derived from plasma etched silicon carbide.,1248957555,9781248957554

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Book Information

Publisher:Unknows
Published In:04-May-2012
ISBN-10:1248957555
ISBN-13:9781248957554
Binding Type:Paperback
Weight:392 gms
Pages:pp. 160

The Title "Electrical characterization of buckled graphene films derived from plasma etched silicon carbide." is written by Tobias Denig. This book was published in the year 0420. The ISBN number 1248957555|9781248957554 is assigned to the Paperback version of this title. This book has total of pp. 160 (Pages). The publisher of this title is Unknows. Electrical characterization of buckled graphene films derived from plasma etched silicon carbide. is currently Not Available with us.You can enquire about this book and we will let you know the availability.