Electromagnetic modeling of darkfield defect detection in patterned wafers.
by Richard LeBaron
| Publisher: | Unknows |
| Published In: | 01-Sep-2011 |
| ISBN-10: | 1243384948 |
| ISBN-13: | 9781243384942 |
| Binding Type: | Paperback |
| Weight: | 363 gms |
| Pages: | pp. 162, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "Electromagnetic modeling of darkfield defect detection in patterned wafers." is written by Richard LeBaron. This book was published in the year 0120. The ISBN number 1243384948|9781243384942 is assigned to the Paperback version of this title. This book has total of pp. 162 (Pages). The publisher of this title is Unknows. Electromagnetic modeling of darkfield defect detection in patterned wafers. is currently Not Available with us.You can enquire about this book and we will let you know the availability.