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Electron Microscopy Studies of Ion Implanted Silicon

by  K. Seshan
Electron Microscopy Studies of Ion Implanted Silicon,1288822413,9781288822416

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Book Information

Publisher:Unknown
Published In:28-Feb-2013
ISBN-10:1288822413
ISBN-13:9781288822416
Binding Type:Paperback
Weight:273 gms
Pages:pp. 110, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss

The Title "Electron Microscopy Studies of Ion Implanted Silicon" is written by K. Seshan. This book was published in the year 2820. The ISBN number 1288822413|9781288822416 is assigned to the Paperback version of this title. This book has total of pp. 110 (Pages). The publisher of this title is Unknown. Electron Microscopy Studies of Ion Implanted Silicon is currently Not Available with us.You can enquire about this book and we will let you know the availability.