Full Field Birefringence Measurement of Grown-In Stresses in Thin Silicon Sheet Final Technical Report
| Publisher: | Unknows |
| Published In: | 20-Jul-2012 |
| ISBN-10: | 1249145651 |
| ISBN-13: | 9781249145653 |
| Binding Type: | Paperback |
| Weight: | 100 gms |
| Pages: | pp. 30, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "Full Field Birefringence Measurement of Grown-In Stresses in Thin Silicon Sheet Final Technical Report" was published in the year 2020. The ISBN number 1249145651|9781249145653 is assigned to the Paperback version of this title. This book has total of pp. 30 (Pages). The publisher of this title is Unknows. Full Field Birefringence Measurement of Grown-In Stresses in Thin Silicon Sheet Final Technical Report is currently Not Available with us.You can enquire about this book and we will let you know the availability.