Genome mapping of end-use quality traits in a wheat recombinant inbred population.
by Toi John Tsilo
| Publisher: | Unknows |
| Published In: | 08-Sep-2011 |
| ISBN-10: | 1243690348 |
| ISBN-13: | 9781243690340 |
| Binding Type: | Paperback |
| Weight: | 457 gms |
| Pages: | pp. 194 |
The Title "Genome mapping of end-use quality traits in a wheat recombinant inbred population." is written by Toi John Tsilo. This book was published in the year 0820. The ISBN number 1243690348|9781243690340 is assigned to the Paperback version of this title. This book has total of pp. 194 (Pages). The publisher of this title is Unknows. Genome mapping of end-use quality traits in a wheat recombinant inbred population. is currently Not Available with us.You can enquire about this book and we will let you know the availability.