Investigation of electrical characteristics of III-V MOS devices with silicon interface passivation layer.
by Feng Zhu
| Publisher: | Unknows |
| Published In: | 10-Sep-2011 |
| ISBN-10: | 1243969318 |
| ISBN-13: | 9781243969316 |
| Binding Type: | Paperback |
| Weight: | 335 gms |
| Pages: | pp. 130 |
The Title "Investigation of electrical characteristics of III-V MOS devices with silicon interface passivation layer." is written by Feng Zhu. This book was published in the year 1020. The ISBN number 1243969318|9781243969316 is assigned to the Paperback version of this title. This book has total of pp. 130 (Pages). The publisher of this title is Unknows. Investigation of electrical characteristics of III-V MOS devices with silicon interface passivation layer. is currently Not Available with us.You can enquire about this book and we will let you know the availability.