Multi-probe experimental and 'bottom-up' computational analysis of correlated defect generation in modern nanoscale transistors.
by Dhanoop Varghese
| Publisher: | Unknows |
| Published In: | 08-Sep-2011 |
| ISBN-10: | 1243743735 |
| ISBN-13: | 9781243743732 |
| Binding Type: | Paperback |
| Weight: | 446 gms |
| Pages: | pp. 188 |
The Title "Multi-probe experimental and 'bottom-up' computational analysis of correlated defect generation in modern nanoscale transistors." is written by Dhanoop Varghese. This book was published in the year 0820. The ISBN number 1243743735|9781243743732 is assigned to the Paperback version of this title. This book has total of pp. 188 (Pages). The publisher of this title is Unknows. Multi-probe experimental and 'bottom-up' computational analysis of correlated defect generation in modern nanoscale transistors. is currently Not Available with us.You can enquire about this book and we will let you know the availability.