On-chip NBTI and Gate-Oxide-Degradation Sensing and Dynamic Management in VLSI circuits.
by Prashant Singh
| Publisher: | Unknows |
| Published In: | 30-Sep-2011 |
| ISBN-10: | 1244678287 |
| ISBN-13: | 9781244678286 |
| Binding Type: | Paperback |
| Weight: | 294 gms |
| Pages: | pp. 122, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "On-chip NBTI and Gate-Oxide-Degradation Sensing and Dynamic Management in VLSI circuits." is written by Prashant Singh. This book was published in the year 3020. The ISBN number 1244678287|9781244678286 is assigned to the Paperback version of this title. This book has total of pp. 122 (Pages). The publisher of this title is Unknows. On-chip NBTI and Gate-Oxide-Degradation Sensing and Dynamic Management in VLSI circuits. is currently Not Available with us.You can enquire about this book and we will let you know the availability.