System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms.
by Ja Yong Koo
| Publisher: | Unknows |
| Published In: | 03-Sep-2011 |
| ISBN-10: | 1243575352 |
| ISBN-13: | 9781243575357 |
| Binding Type: | Paperback |
| Weight: | 284 gms |
| Pages: | pp. 116, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms." is written by Ja Yong Koo. This book was published in the year 0320. The ISBN number 1243575352|9781243575357 is assigned to the Paperback version of this title. This book has total of pp. 116 (Pages). The publisher of this title is Unknows. System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms. is currently Not Available with us.You can enquire about this book and we will let you know the availability.