Using Integrated Circuits as Virtual Test Structures To Extract Defect Density and Size Distributions.
by Jeffrey E Nelson
| Publisher: | Unknown |
| Published In: | 02-Sep-2011 |
| ISBN-10: | 1243460148 |
| ISBN-13: | 9781243460141 |
| Binding Type: | Paperback |
| Weight: | 515 gms |
| Pages: | pp. 250, 50:B&W 7.44 x 9.69 in or 246 x 189 mm (Crown 4vo) Perfect Bound on White w/Gloss |
The Title "Using Integrated Circuits as Virtual Test Structures To Extract Defect Density and Size Distributions." is written by Jeffrey E Nelson. This book was published in the year 0220. The ISBN number 1243460148|9781243460141 is assigned to the Paperback version of this title. This book has total of pp. 250 (Pages). The publisher of this title is Unknown. Using Integrated Circuits as Virtual Test Structures To Extract Defect Density and Size Distributions. is currently Not Available with us.You can enquire about this book and we will let you know the availability.